Tier 1 RG191/17

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81 to 90 of 114 Results

Figure 3a.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 144.1 KB - MD5: 0f057a0a2f458e1a93373d4cead6db3e Data Simulated transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 3b.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 877.4 KB - MD5: 38c90e581b97e874d01c2aada15bb5cb Data Simulated transmission phase difference (Δφ, degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 3c.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 154.4 KB - MD5: f4d3447afb1efc60f86afbb00b738e7f Data Experimentally measured transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 3d.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 311.8 KB - MD5: c00818649fc9763da51e6505f29b25a7 Data Experimentally measured transmission phase difference (Δφ degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 4a_Simulation.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 127.3 KB - MD5: 88e8e97755f1434bd9c5f39f25771829 Data Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on COC substrates, with respect to the corresponding uncoated metamaterials.
Figure 4b_Simulation_Kapton.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 124.4 KB - MD5: f664e4521b045f9d33bc2f97e12ca344 Data Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on Kapton substrates, with respect to the corresponding uncoated metamaterials.
Figure 4c.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 12.1 KB - MD5: 51160761e5f231cb184520d1cf24cfbd Data Peak-to-peak transmission amplitude difference (ΔT) with a change in the refractive indices of the 40 nm thick analyte placed on the TASR metamaterial residing on COC and Kapton substrates.
Figure S1_a_graph.jpg May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces JPEG Image - 908.5 KB - MD5: 3a4a6e2aea2a93e4573f90688fc92e5b Data Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).
Figure S1_a_picture.tif May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces TIFF Image - 2.6 MB - MD5: 530c82d75bbabd1f7dc3cafcce92327e Data Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).
Figure S1_b.png May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces PNG Image - 431.7 KB - MD5: da170156cf273377f07519ed5e0827a3 Data Experimentally measured thickness of the thermally deposited 20 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure 3a.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 144.1 KB -

Data

Simulated transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 3b.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 877.4 KB -

Data

Simulated transmission phase difference (Δφ, degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 3c.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 154.4 KB -

Data

Experimentally measured transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 3d.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 311.8 KB -

Data

Experimentally measured transmission phase difference (Δφ degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 4a_Simulation.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 127.3 KB -

Data

Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on COC substrates, with respect to the corresponding uncoated metamaterials.

Figure 4b_Simulation_Kapton.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 124.4 KB -

Data

Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on Kapton substrates, with respect to the corresponding uncoated metamaterials.

Figure 4c.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 12.1 KB -

Data

Peak-to-peak transmission amplitude difference (ΔT) with a change in the refractive indices of the 40 nm thick analyte placed on the TASR metamaterial residing on COC and Kapton substrates.

Figure S1_a_graph.jpg

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

JPEG Image - 908.5 KB -

Data

Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure S1_a_picture.tif

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

TIFF Image - 2.6 MB -

Data

Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure S1_b.png

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

PNG Image - 431.7 KB -

Data

Experimentally measured thickness of the thermally deposited 20 nm Ge thin film using Atomic Force Microscopy (AFM).

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