Tier 1 RG191/17

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91 to 100 of 123 Results

Figure 3c.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 154.4 KB - MD5: f4d3447afb1efc60f86afbb00b738e7f Data Experimentally measured transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 3d.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 311.8 KB - MD5: c00818649fc9763da51e6505f29b25a7 Data Experimentally measured transmission phase difference (Δφ degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.
Figure 4a_Simulation.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 127.3 KB - MD5: 88e8e97755f1434bd9c5f39f25771829 Data Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on COC substrates, with respect to the corresponding uncoated metamaterials.
Figure 4b_Simulation_Kapton.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 124.4 KB - MD5: f664e4521b045f9d33bc2f97e12ca344 Data Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on Kapton substrates, with respect to the corresponding uncoated metamaterials.
Figure 4c.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 12.1 KB - MD5: 51160761e5f231cb184520d1cf24cfbd Data Peak-to-peak transmission amplitude difference (ΔT) with a change in the refractive indices of the 40 nm thick analyte placed on the TASR metamaterial residing on COC and Kapton substrates.
Figure S1_a_graph.jpg May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces JPEG Image - 908.5 KB - MD5: 3a4a6e2aea2a93e4573f90688fc92e5b Data Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).
Figure S1_a_picture.tif May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces TIFF Image - 2.6 MB - MD5: 530c82d75bbabd1f7dc3cafcce92327e Data Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).
Figure S1_b.png May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces PNG Image - 431.7 KB - MD5: da170156cf273377f07519ed5e0827a3 Data Experimentally measured thickness of the thermally deposited 20 nm Ge thin film using Atomic Force Microscopy (AFM).
Figure S2.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 223.3 KB - MD5: cc1004dc1be8717d5514543ee4ee5c0a Data Peak-to-peak phase difference (\|Δϕ) with change in refractive indices of the 40 nm thick analyte placed on TASR metamaterial residing on COC and Kapton substrates.
Figure S3.opj May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces Unknown - 375.8 KB - MD5: d73148fa9407a35c81c6f4efd67cf9ee Data a) Simulated transmission amplitude spectra of TASR metamaterial coated with 40 nm thick analyte of different refractive indices on the metamaterial sample residing on COC substrate. b) Simulated transmission amplitude spectra of TASR metamaterial coated with 40 nm thick analyte...

Figure 3c.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 154.4 KB -

Data

Experimentally measured transmission amplitude difference (ΔT) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 3d.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 311.8 KB -

Data

Experimentally measured transmission phase difference (Δφ degree) for the analyte overlayer of thicknesses ranging from 0 to 40 nm.

Figure 4a_Simulation.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 127.3 KB -

Data

Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on COC substrates, with respect to the corresponding uncoated metamaterials.

Figure 4b_Simulation_Kapton.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 124.4 KB -

Data

Simulated transmission amplitude difference (ΔT) with an analyte of thickness 40 nm but a different refractive index placed on the TASR metamaterial residing on Kapton substrates, with respect to the corresponding uncoated metamaterials.

Figure 4c.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 12.1 KB -

Data

Peak-to-peak transmission amplitude difference (ΔT) with a change in the refractive indices of the 40 nm thick analyte placed on the TASR metamaterial residing on COC and Kapton substrates.

Figure S1_a_graph.jpg

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

JPEG Image - 908.5 KB -

Data

Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure S1_a_picture.tif

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

TIFF Image - 2.6 MB -

Data

Experimentally measured thickness of the thermally deposited 7 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure S1_b.png

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

PNG Image - 431.7 KB -

Data

Experimentally measured thickness of the thermally deposited 20 nm Ge thin film using Atomic Force Microscopy (AFM).

Figure S2.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 223.3 KB -

Data

Peak-to-peak phase difference (|Δϕ) with change in refractive indices of the 40 nm thick analyte placed on TASR metamaterial residing on COC and Kapton substrates.

Figure S3.opj

May 14, 2020 - Replication Data for: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces

Unknown - 375.8 KB -

Data

a) Simulated transmission amplitude spectra of TASR metamaterial coated with 40 nm thick analyte of different refractive indices on the metamaterial sample residing on COC substrate. b) Simulated transmission amplitude spectra of TASR metamaterial coated with 40 nm thick analyte...

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