181 to 190 of 195 Results
Unknown - 424.6 KB -
MD5: bc662ce1a602dfbee16aba6a76fee74a
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Unknown - 31.3 KB -
MD5: dbb8c7f3395bfd91337432f949b82b2d
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Jan 2, 2026 - LOH Zhi Heng
Loh, Zhi Heng; Xu, Ce; Zhou, Guoqing; Alexeev, Evgeny M.; Cadore, Alisson R.; Paradisanos, Ioannis; Ott, Anna K.; Soavi, Giancarlo; Tongay, Sefaattin; Cerullo, Giulio; Ferrari, Andrea C.; Prezhdo, Oleg V., 2026, "Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling", https://doi.org/10.21979/N9/8PBMPA, DR-NTU (Data), V1
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling |
Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 81.2 KB -
MD5: 882808fd504d3008e873163b31a40e48
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Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 1001.0 KB -
MD5: 811377916e658e93bfd18b904c9b027b
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Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 349.7 KB -
MD5: 22524bcd65c0999c36347186ee2703c4
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Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 152.8 KB -
MD5: d57f803d72c2b04945019fc7b2952465
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Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 60.2 KB -
MD5: 0e8cdda08066de0cc429de9edf2934e9
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Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 59.8 KB -
MD5: e0ed656674f36c62261a0077a938f2e9
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Jan 2, 2026 - LOH Zhi Heng
Loh, Zhi Heng; Xu, Ce; Barden, Natalie; Alexeev, Evgeny M.; Wang, Xiaoli; Long, Run; Cadore, Alisson R.; Paradisanos, Ioannis; Ott, Anna K.; Soavi, Giancarlo; Tongay, Sefaattin; Cerullo, Giulio; Ferrari, Andrea C.; Prezhdo, Oleg V., 2026, "Replication Data for: Ultrafast Charge Transfer and Recombination Dynamics in Monolayer–Multilayer WSe2 Junctions Revealed by Time-Resolved Photoemission Electron Microscopy", https://doi.org/10.21979/N9/PDTBBV, DR-NTU (Data), V1
Replication Data for: Ultrafast Charge Transfer and Recombination Dynamics in Monolayer–Multilayer WSe2 Junctions Revealed by Time-Resolved Photoemission Electron Microscopy |
