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Oct 4, 2020
Righetto, Marcello; Giovanni, David; Lim,Swee Sien; Lim, Melvin Jia Wei; Zhang, Qiannan; Ramesh, Sankaran; Tay, Eugene Yong Kang; Sum, Tze Chien, 2020, "Replication Data for: Hot Carriers Perspective on the Nature of Traps in Perovskites", https://doi.org/10.21979/N9/EGH6UI, DR-NTU (Data), V1, UNF:6:Ud8rdQUE51iNRiEebr7UUg== [fileUNF]
The defects in lead halide perovskites are usually regarded benign to their optoelectronic properties but it remains a question to what extent. Here Righetto et al. quantify how hot carriers experience increased trapping rates at the defects, making them less benign and develop a... |
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