21 to 30 of 123 Results
Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 349.7 KB -
MD5: 22524bcd65c0999c36347186ee2703c4
|
Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 152.8 KB -
MD5: d57f803d72c2b04945019fc7b2952465
|
Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 60.2 KB -
MD5: 0e8cdda08066de0cc429de9edf2934e9
|
Jan 2, 2026 -
Replication Data for: Ultrafast Electronic Relaxation Dynamics of Atomically Thin MoS2 Is Accelerated by Wrinkling
Unknown - 59.8 KB -
MD5: e0ed656674f36c62261a0077a938f2e9
|
Jan 2, 2026
Loh, Zhi Heng; Xu, Ce; Barden, Natalie; Alexeev, Evgeny M.; Wang, Xiaoli; Long, Run; Cadore, Alisson R.; Paradisanos, Ioannis; Ott, Anna K.; Soavi, Giancarlo; Tongay, Sefaattin; Cerullo, Giulio; Ferrari, Andrea C.; Prezhdo, Oleg V., 2026, "Replication Data for: Ultrafast Charge Transfer and Recombination Dynamics in Monolayer–Multilayer WSe2 Junctions Revealed by Time-Resolved Photoemission Electron Microscopy", https://doi.org/10.21979/N9/PDTBBV, DR-NTU (Data), V1
Replication Data for: Ultrafast Charge Transfer and Recombination Dynamics in Monolayer–Multilayer WSe2 Junctions Revealed by Time-Resolved Photoemission Electron Microscopy |
Unknown - 631.4 KB -
MD5: 2ec3e989c0506af48439ac3c3da2f43e
|
Unknown - 172.0 KB -
MD5: 86935c3014005496b660a515e1c47208
|
Unknown - 658.0 KB -
MD5: 50aa0d2182cdb1566cdc3466166872b8
|
Unknown - 159.9 KB -
MD5: 46a95ccc718afd02019ce0c6ee7cb393
|
Unknown - 106.7 KB -
MD5: 801feda2edf20528b6e5011ed543b98b
|
