Related data for: Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics (doi:10.21979/N9/WCSPEO)

View:

Part 1: Document Description
Part 2: Study Description
Part 5: Other Study-Related Materials
Entire Codebook

(external link) (external link)

Document Description

Citation

Title:

Related data for: Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics

Identification Number:

doi:10.21979/N9/WCSPEO

Distributor:

DR-NTU (Data)

Date of Distribution:

2020-04-19

Version:

2

Bibliographic Citation:

Tiwari, Nidhi; Rajput, Mayank; John, Rohit Abraham; Nguyen, Anh Chien; Mathews, Nripan, 2020, "Related data for: Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics", https://doi.org/10.21979/N9/WCSPEO, DR-NTU (Data), V2

Study Description

Citation

Title:

Related data for: Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics

Identification Number:

doi:10.21979/N9/WCSPEO

Authoring Entity:

Tiwari, Nidhi (Nanyang Technological University)

Rajput, Mayank (Nanyang Technological University)

John, Rohit Abraham (Nanyang Technological University)

Nguyen, Anh Chien (Nanyang Technological University)

Mathews, Nripan (Nanyang Technological University)

Software used in Production:

Origin

Grant Number:

Tier 1 grant RG166/16

Grant Number:

Tier 2 grant MOE2016-T2-1-100

Distributor:

DR-NTU (Data)

Access Authority:

Nidhi Tiwari

Access Authority:

Nripan Mathews

Depositor:

Nidhi Tiwari

Date of Deposit:

2018-11-23

Holdings Information:

https://doi.org/10.21979/N9/WCSPEO

Study Scope

Keywords:

Engineering, Engineering, flexible thin film transistor, indium tungsten oxide, synaptic transistor, thin films, transparent amorphous oxide semiconductor (TAOS)

Abstract:

Thin-film transistors (TFTs) with high electrical performances (mobility > 10 cm2/V s, Vth < 1 V, SS < 1 V/decade, on/off ratio ≈ 106) obtained from the silicon- and oxide-based single-crystalline semiconductor materials require high processing temperature and hence are not suitable for flexible electronics. Amorphous oxide-based transparent electronic devices are attractive to meet emerging technological demands where crystalline oxide-/silicon-based architectures cannot provide a solution. Here, we tackle this problem by using a novel amorphous oxide semiconducting material—namely, indium tungsten oxide (IWO)—as the active channel in flexible TFTs (FTFTs). Post-annealing temperature as low as 270 °C for amorphous IWO thin films deposited by radio frequency sputtering at room temperature could result in smooth morphology (Rrms ≈ 0.42 nm), good adhesion, and high carrier density (n ≈ 7.19 × 1018 cm–3). Excellent TFT characteristics of flexible devices could be achieved with linear field effect mobility μFE ≈ 25.86 cm2/V s, subthreshold swing SS ≈ 0.30 V/decade, threshold voltage Vth ≈ −1.5 V, and on/off ratio Ion/Ioff ≈ 5.6 × 105 at 3 V and stable operation during bending of the FTFT. Additionally, IWO TFTs were implemented as synapses, the building block for neuromorphic computing. Paired-pulse facilitation up to 138% was observed and showed an exponential decay resembling chemical synapses. Utilizing this characteristic, a high-pass dynamic temporal filter was devised providing increased gain from 1.55 to 21 when frequency was raised from 22 to 62 Hz. The high performance and stability of flexible TFTs obtained with IWO films demonstrate their promise for low-voltage electronic applications.

Kind of Data:

measurements from atomic force microsopy (AFM)

Kind of Data:

contact angle measurements Data

Kind of Data:

measurements from X-ray powder diffraction (XRD)

Kind of Data:

ATR spectrum data

Kind of Data:

transmittance data from UV/Vis Spectrophotometer

Kind of Data:

Keithley 4200 semiconductor characterization data

Methodology and Processing

Sources Statement

Data Access

Other Study Description Materials

Related Publications

Citation

Identification Number:

10.1021/acsami.8b06956

Bibliographic Citation:

Tiwari, N., Rajput, M., John, R. A., Kulkarni, M. R., Nguyen, A. C., & Mathews, N. (2018). Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics. ACS Applied Materials & Interfaces, 10(36), 30506-30513.

Citation

Identification Number:

10356/104476

Bibliographic Citation:

Tiwari, N., Rajput, M., John, R. A., Kulkarni, M. R., Nguyen, A. C., & Mathews, N. (2018). Indium Tungsten Oxide Thin Films for Flexible High-Performance Transistors and Neuromorphic Electronics. ACS Applied Materials & Interfaces, 10(36), 30506-30513.

Other Study-Related Materials

Label:

Figure 1.zip

Notes:

application/x-7z-compressed

Other Study-Related Materials

Label:

Figure 2.zip

Notes:

application/x-7z-compressed

Other Study-Related Materials

Label:

Figure 3.zip

Notes:

application/x-7z-compressed

Other Study-Related Materials

Label:

Figure 4.zip

Notes:

application/x-7z-compressed

Other Study-Related Materials

Label:

Figure 5.zip

Notes:

application/x-7z-compressed

Other Study-Related Materials

Label:

Supporting figures.zip

Notes:

application/x-7z-compressed