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Part 1: Document Description
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Citation |
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Title: |
Related Data for: Synapse and tunable leaky-integrate neuron functions enabled by oxide trapping dynamics in a single logic transistor |
Identification Number: |
doi:10.21979/N9/RYB4AO |
Distributor: |
DR-NTU (Data) |
Date of Distribution: |
2022-05-05 |
Version: |
1 |
Bibliographic Citation: |
Ang, Diing Shenp; Ju, Xin, 2022, "Related Data for: Synapse and tunable leaky-integrate neuron functions enabled by oxide trapping dynamics in a single logic transistor", https://doi.org/10.21979/N9/RYB4AO, DR-NTU (Data), V1 |
Citation |
|
Title: |
Related Data for: Synapse and tunable leaky-integrate neuron functions enabled by oxide trapping dynamics in a single logic transistor |
Identification Number: |
doi:10.21979/N9/RYB4AO |
Authoring Entity: |
Ang, Diing Shenp (Nanyang Technological University) |
Ju, Xin (Nanyang Technological University) |
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Software used in Production: |
Origin |
Grant Number: |
MOE-T2EP50120-0003 |
Distributor: |
DR-NTU (Data) |
Access Authority: |
Ang, Diing Shenp |
Depositor: |
Ang, Diing Shenp |
Date of Deposit: |
2022-05-05 |
Holdings Information: |
https://doi.org/10.21979/N9/RYB4AO |
Study Scope |
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Keywords: |
Engineering, Engineering, artificial synapse and spiking neuron, neuromorphic devices/computing, artificial intelligence |
Abstract: |
Measurement data |
Kind of Data: |
Measurement data |
Methodology and Processing |
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Sources Statement |
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Data Access |
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Notes: |
Please email to request for access. |
Other Study Description Materials |
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Related Publications |
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Citation |
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Identification Number: |
10.1109/LED.2022.3162639 |
Bibliographic Citation: |
Ju, X., & Ang, D. S. (2022). Synapse and Tunable Leaky-Integrate Neuron Functions Enabled by Oxide Trapping Dynamics in a Single Logic Transistor. IEEE Electron Device Letters, 43(5), 793-796. |
Label: |
Measurement Data.pptx |
Notes: |
application/vnd.openxmlformats-officedocument.presentationml.presentation |