Replication Data for: Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics (doi:10.21979/N9/DWYGO3)

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Part 1: Document Description
Part 2: Study Description
Part 3: Data Files Description
Part 4: Variable Description
Part 5: Other Study-Related Materials
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Replication Data for: Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics

doi:10.21979/N9/DWYGO3

DR-NTU (Data)

2020-04-23

1

Kulkarni, Mohit Rameshchandra, 2020, "Replication Data for: Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics", https://doi.org/10.21979/N9/DWYGO3, DR-NTU (Data), V1, UNF:6:mma0mF/haZQCCJPLhPdRMw== [fileUNF]

Replication Data for: Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics

doi:10.21979/N9/DWYGO3

Kulkarni, Mohit Rameshchandra (Nanyang Technological University)

Keithley

MOE Tier 1 Grants RG 166/16

MOE Tier 2 Grant MOE2016-T2-1-100

DR-NTU (Data)

Kulkarni, Mohit Rameshchandra

Kulkarni, Mohit

2020-04-23

https://doi.org/10.21979/N9/DWYGO3

Engineering, Engineering, Amorphous metal oxides, field‐driven athermal activation, neuromorphic electronics, programmable logic circuits

Dataset for figures in "Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics"

Keithley 4200 semiconductor characterization data

measurements from atomic force microsopy (AFM)

measurements from X-ray powder diffraction (XRD)

10.1002/smll.201901457

Kulkarni, M. R., John, R. A., Tiwari, N., Nirmal, A., Ng, S. E., Nguyen, A. C., & Mathews, N. (2019). Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics. Small, 15(27), 1901457.

10356/138083

Kulkarni, M. R., John, R. A., Tiwari, N., Nirmal, A., Ng, S. E., Nguyen, A. C., & Mathews, N. (2019). Field‐Driven Athermal Activation of Amorphous Metal Oxide Semiconductors for Flexible Programmable Logic Circuits and Neuromorphic Electronics. Small, 15(27), 1901457.

• Number of cases: 182

• No. of variables per record: 16

• Type of File: text/tab-separated-values

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• Number of cases: 182

• No. of variables per record: 16

• Type of File: text/tab-separated-values

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• Number of cases: 7

• No. of variables per record: 4

• Type of File: text/tab-separated-values

UNF:6:IEm0pWOW++ywTMmTCYoGyQ==

• Number of cases: 92

• No. of variables per record: 12

• Type of File: text/tab-separated-values

UNF:6:OrHvLwg/7X3/sc8wwcYZMQ==

• Number of cases: 92

• No. of variables per record: 12

• Type of File: text/tab-separated-values

UNF:6:ULU0JefCTQjTf+k3bnv4eg==

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Summary Statistics: StDev NaN; Min. NaN; Valid 0.0; Mean NaN; Max. NaN

Variable Format: numeric

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Variable Format: character

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f26781 Location:

Summary Statistics: Mean NaN; StDev NaN; Valid 0.0; Min. NaN; Max. NaN;

Variable Format: numeric

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f26848 Location:

Variable Format: character

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f26848 Location:

Summary Statistics: Min. NaN; Max. NaN; Valid 0.0; Mean NaN; StDev NaN

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Variable Format: character

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f26848 Location:

Variable Format: character

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f26848 Location:

Summary Statistics: Min. NaN; Valid 0.0; StDev NaN; Mean NaN; Max. NaN

Variable Format: numeric

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Variable Format: character

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Variable Format: character

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Summary Statistics: Min. 0.2114995117122179; Valid 6.0; Mean 602.4324101447155; Max. 1761.23; StDev 650.1371208150841

Variable Format: numeric

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f26796 Location:

Summary Statistics: Min. 0.046910409225294644; Mean 284.6366471255766; StDev 256.93119051662217; Max. 532.3; Valid 6.0;

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Summary Statistics: Mean NaN; Max. NaN; Valid 0.0; StDev NaN; Min. NaN

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Variable Format: character

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Summary Statistics: StDev 330.6199174464825; Mean 120.82590675314813; Min. -6.20229; Max. 1000.0; Valid 9.0

Variable Format: numeric

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Summary Statistics: Max. 1000.0; Valid 4.0; StDev 483.7989587529448; Min. -0.19688; Mean 277.45078;

Variable Format: numeric

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f26824 Location:

Summary Statistics: Valid 3.0; Mean 377.66666666666663; StDev 542.1220649755305; Min. 8.0; Max. 1000.0

Variable Format: numeric

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f26824 Location:

Summary Statistics: Valid 3.0; Mean 385.55555555555554; Max. 1000.0; StDev 536.9288524493655; Min. 6.666666666666667;

Variable Format: numeric

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f26824 Location:

Summary Statistics: StDev 531.9597000233942; Min. 5.714285714285714; Max. 1000.0; Valid 3.0; Mean 393.57142857142856

Variable Format: numeric

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f26824 Location:

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f26824 Location:

Summary Statistics: Mean 2445798.682353897; Max. 7337396.046920699; Min. 1.92154E-11; StDev 4236247.582799861; Valid 3.0

Variable Format: numeric

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f26824 Location:

Summary Statistics: StDev 793706.8360813161; Max. 1374740.5666274913; Mean 458246.8556891032; Min. 3.19928E-10; Valid 3.0;

Variable Format: numeric

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Summary Statistics: Max. NaN; Valid 0.0; Min. NaN; StDev NaN; Mean NaN

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f26845 Location:

Variable Format: character

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f26845 Location:

Summary Statistics: Mean 123.53412126154254; Max. 1000.0; StDev 329.51963467323424; Min. 2.8332799999999995E-8; Valid 9.0

Variable Format: numeric

Notes: UNF:6:E/O/9h/eptZVhs9N0sz93g==

f26845 Location:

Summary Statistics: Max. 1000.0; Valid 3.0; StDev 547.4486277268397; Mean 370.0; Min. 10.0

Variable Format: numeric

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f26845 Location:

Summary Statistics: Min. 8.0; StDev 542.1220649755305; Valid 3.0; Mean 377.66666666666663; Max. 1000.0;

Variable Format: numeric

Notes: UNF:6:jqZ6G3yHPVD3i5f8nyIYaA==

f26845 Location:

Summary Statistics: Valid 3.0; StDev 536.9288524493655; Max. 1000.0; Min. 6.666666666666667; Mean 385.55555555555554

Variable Format: numeric

Notes: UNF:6:nYf7/0EfIE8NPQg4wIsDFw==

f26845 Location:

Summary Statistics: Min. 5.714285714285714; Valid 3.0; Max. 1000.0; Mean 393.57142857142856; StDev 531.9597000233942

Variable Format: numeric

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Variable Format: character

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f26845 Location:

Variable Format: character

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f26845 Location:

Variable Format: character

Notes: UNF:6:MiXbcnwGAfAne6rcUZvp2Q==

f26845 Location:

Summary Statistics: StDev 4236247.582799861; Max. 7337396.046920699; Valid 3.0; Mean 2445798.682353897; Min. 1.92154E-11

Variable Format: numeric

Notes: UNF:6:Ks0vPb9+gun5IjwgYMn9Tg==

f26845 Location:

Summary Statistics: Valid 3.0; Mean 458246.8556891032; StDev 793706.8360813161; Max. 1374740.5666274913; Min. 3.19928E-10;

Variable Format: numeric

Notes: UNF:6:BeDsTUmm7xfe3BieJmY6Ew==

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